Version du 18 juin 2016 à 14:06

Abstract

This paper is the proposition of a method of energy characterization using non-intrusive measurements.
Foremost, the author presents us the problematic : we are now able to build tiny platforms with tremendous processing power, but, this processing power needs a lot of energy to work.
Hence our need to measure the energy consumption of every platform in order to improve them in energetic level.
For these measurements, we can built our models following several methods. The two mentioned are either electrical stimulation or inter/extrapolation form measures on a prototype.

The second section of the paper is about the state of the art of the non-intrusive measurement.
This part talkls about different methods used to characterize VLSI (Very Large Scale Integration) circuits. These VLSI circuits can be organized using two criteria : the level of hardware abstraction of the circuit and the calibration method.
For the first criterion there are many methods that can be used to measure the enegy consumption :
- For the least abstract circuits we can compute every change of state for all the transistors in the circuit. This is an very accurate solution but a very long one to simulate.